This tool is a special microscope. 

This tool is a special microscope. 

An electron microscope is a powerful tool. 



An electron microscope is a special tool used to see the tiny world. 

There are different ways these machines work. In a transmission electron microscope, or TEM, a beam of electrons goes through a thin sample. 
Many scientists helped build the history of this tool. In 1883, Hertz worked with a cathode-ray tube to move electron beams. 

Different models were made for different jobs over the years. Siemens produced the first commercial electron microscope in 1938. In 1939, they also made a transmission electron microscope. By 1965, Albert Crewe introduced the scanning transmission electron microscope, or STEM. 
These microscopes help us understand the very building blocks of our world. High-resolution machines can even find the exact positions of atoms. 
An electron microscope is a powerful scientific instrument used to observe the microscopic world. 

The most fundamental type is the transmission electron microscope, or TEM. In a TEM, an electron gun produces a high-voltage electron beam. These electrons typically have energies between 20 and 400 keV. Electromagnetic lenses then focus this beam onto a very thin specimen. As the electrons pass through the sample, they carry structural information about it.
Another major type is the scanning electron microscope, or SEM. Unlike the TEM, the SEM uses electrons with much lower energy, generally below 20 keV. Instead of passing through a sample, the SEM probes the surface with a focused beam. This beam performs a process called raster scanning, where it moves across the specimen. When the beam hits the sample, it causes various interactions. These interactions result in the emission of secondary electrons, backscattered electrons, or X-rays. 
A third specialized type is the scanning transmission electron microscope, or STEM. The STEM combines features from both the TEM and the SEM. It uses a focused probe that is rastered across a specimen, similar to an SEM. However, it primarily detects the electrons that are transmitted through the sample, like a TEM.
The history of this technology is a series of important discoveries. In 1883, Heinrich Hertz demonstrated how to manipulate electron beams using a cathode-ray tube. In 1899, Emil Wiechert showed how to focus electrons using an axial magnetic field. Arthur Wehnelt improved the production of electrons in 1905 with oxide-coated cathodes. Hans Busch made a major breakthrough in 1926 by developing the electromagnetic lens. In 1931, Max Knoll and Ernst Ruska used two magnetic lenses to create the first magnified images of mesh grids. 
There is significant historical debate regarding the true inventor of the device. While Knoll and Ruska are famous for their 1931 work, Reinhold Rüdenberg at Siemens-Schuckert also worked on the technology. Rüdenberg filed patents in 1932 and claimed his work was parallel to the university research. In 1933, Ruska and Knoll built a microscope that surpassed the resolution of light microscopes. By 1937, Ernst Ruska and Bodo von Borries were working with Siemens to develop applications for biological specimens. Siemens eventually produced the first commercial electron microscope in 1938. 
Advancements in the late 20th century further transformed the field. In 1965, Albert Crewe introduced the STEM using a field emission source. By the early 1980s, higher accelerating voltages and better mechanical stability allowed for imaging at the atomic scale. The field emission gun became a common standard in the 1980s, which improved image quality by reducing chromatic aberrations. In the 2000s, researchers focused on aberration-corrected microscopy to improve clarity. These tools allow scientists to study the interaction volume of electrons with matter in great detail.
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